SLVK244 January 2026 TRF0213-SEP
- 1
- 2
- Trademarks
- 1Overview
- 2Single-Event Effects
- 3Test Device and Evaluation Board Information
- 4Irradiation Facility and Setup
- 5Depth, Range, and LETEFF Calculation
- 6Test Set-Up and Procedures
- 7Single-Event Latch-up (SEL) Results
- 8Single-Event Transients (SET) Results
- 9Summary
- A Total Ionizing Dose from SEE Experiments
- B References
3 Test Device and Evaluation Board Information
The TRF0213-SEP is packaged in a 12-pin RPV, WQFN - Flip Chip RLF (WQFN-FCRLF, 12) package as shown in Figure 3-1. The TRF0213SEP-EVM evaluation board (EVM) was used to evaluate the single-events-effects (SEE) of the TRF0213-SEP. Top view of the evaluation board used for the radiation testing in shown in Figure 3-2. Schematic of the evaluation board used for radiation testing is shown in Figure 3-3. For more technical information about the TRF0213-SEP, see TRF0213-SEP's technical documents.
Figure 3-1 Decapped TRF0213-SEP (Left) and Device Pin Out (Right)
Figure 3-2 TRF0213SEP-EVM Board Top View
Figure 3-3 TRF0213SEP-EVM, Evaluation Module Board Schematic for SEE Testing