SLVK244 January 2026 TRF0213-SEP
- 1
- 2
- Trademarks
- 1Overview
- 2Single-Event Effects
- 3Test Device and Evaluation Board Information
- 4Irradiation Facility and Setup
- 5Depth, Range, and LETEFF Calculation
- 6Test Set-Up and Procedures
- 7Single-Event Latch-up (SEL) Results
- 8Single-Event Transients (SET) Results
- 9Summary
- A Total Ionizing Dose from SEE Experiments
- B References
7 Single-Event Latch-up (SEL) Results
During SEL characterization, the device was heated using a closed-loop PID controlled heat gun [MISTRAL 6 System (120V, 2400W)] to 125°C. The temperature of the die was constantly monitored during the testing at TAMU through an IR camera integrated into the control loop to create closed-loop temperature control. The DUT temperature was monitored prior to being irradiated with a FLIR IR-camera to maintain the die-exposed temperature, and hence the junction temperature as shown in Table 7-1. The devices were exposed to a Silver (Ag) heavy-ion beam with normal incidence (0° angle) to the die surface, 40mm airgap, providing an effective Linear Energy Transfer (LET) of 56.1 MeV-cm2/mg. The irradiation was conducted at a flux rate of 1 × 10? ions/cm2·s with fluences of 1 × 10? ions/cm2 and 2 × 10? ions/cm2 per test run.
The majority of test runs were performed with the device powered at the maximum recommended supply voltage of +5.25V, while a subset of runs utilized the absolute maximum supply voltage of +5.5V. Throughout all irradiation runs, each device actively amplified a single-ended input signal at 500MHz. The quiescent current on the VDD supply pin was continuously monitored and recorded during testing, while the device output was simultaneously monitored using an oscilloscope. A total of three devices underwent SEL testing.
Time duration to achieve this fluence was approximately 2 minutes. No SEL events were observed under any of the test runs, indicating that the TRF0213-SEP is SEL-immune at a die-exposed temperature of T = 125°C and LET = 56.1MeV-cm2/mg. A supply current vs time plot is shown on Figure 7-1.
Run # | Unit # | Die-Exposed Temp. (°C) | Ion Type | Incident Angle (°) | Fluence (× 106 ions/cm2) | Average Flux (× 104 ions-cm2/mg) | VDD (V) | Actual LETEFF (MeV-cm2/mg) | Uniformity (%) | Input Power (dBm) at 500MHz | Diff. Output Load (Ω) | Approx VOUT on Scope (mVPP) | SEL Result |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
1 | 1 | 125 | Ag (107) | 0 | 19.90 | 11.80 | 5.25 | 56.1 | 92 | -10 | 100 | 500 | Pass |
2 | 1 | 125 | Ag (107) | 0 | 20.00 | 8.86 | 5.25 | 56.1 | 94 | -10 | 100 | 500 | Pass |
3 | 1 | 125 | Ag (107) | 0 | 20.00 | 9.94 | 5.5 | 56.1 | 94 | 10 | 100 | 1300 | Pass |
4 | 1 | 125 | Ag (107) | 0 | 9.95 | 9.98 | 5.25 | 56.1 | 94 | 20 | 100 | 1400 | Pass |
5 | 2 | 125 | Ag (107) | 0 | 9.95 | 9.89 | 5.25 | 56.1 | 94 | -10 | 100 | 500 | Pass |
6 | 2 | 125 | Ag (107) | 0 | 9.95 | 10.20 | 5.25 | 56.1 | 94 | 10 | 100 | 1300 | Pass |
7 | 2 | 125 | Ag (107) | 0 | 20.00 | 10.40 | 5.5 | 56.1 | 94 | 20 | 100 | 1400 | Pass |
8 | 2 | 125 | Ag (107) | 0 | 20.00 | 10.80 | 5.25 | 56.1 | 93 | 20 | 100 | 1400 | Pass |
9 | 3 | 125 | Ag (107) | 0 | 9.98 | 10.70 | 5.25 | 56.1 | 91 | -10 | 100 | 500 | Pass |
10 | 3 | 125 | Ag (107) | 0 | 10.00 | 10.50 | 5.5 | 56.1 | 92 | 0 | 100 | 1300 | Pass |
11 | 3 | 125 | Ag (107) | 0 | 20.00 | 11.20 | 5.5 | 56.1 | 94 | 20 | 100 | 1400 | Pass |
12 | 3 | 125 | Ag (107) | 0 | 20.00 | 11.20 | 5.25 | 56.1 | 95 | -10 | 100 | 500 | Pass |
Figure 7-1 Supply Current versus Time Data for SEL Run #4 for the TRF0213-SEP
Figure 7-2 Supply Current versus Time Data for SEL Run #5 for the TRF0213-SEP
Figure 7-3 Supply Current versus Time Data for SEL Run #11 for the TRF0213-SEP