SLVK231 November 2025 TPS7H4104-SEP
- 1
- Abstract
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 LETEFF and Range Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
3 Device and Test Board Information
The TPS7H4104-SEP is packaged in a 64-pin plastic package as shown in Figure 3-1. The TPS7H4104EVM was used to evaluate the performance and characteristics of the TPS7H4104-SEP under heavy ion radiation. The TPS7H4104EVM is shown in Figure 3-2. The schematic is shown in Figure 3-3. For further detail please reference the TPS7H4104EVM User's Guide.
![TPS7H4104-SEP Photograph of Delidded TPS7H4104-SEP [Left] and Pinout Diagram [Right]](/ods/images/SLVK231/GUID-20251022-SS0I-OQQG-WWDZ-H91ZP5LDXPUZ-low.svg "TPS7H4104-SEP Photograph of Delidded TPS7H4104-SEP [Left] and Pinout Diagram [Right]")
Figure 3-1 Photograph of Delidded TPS7H4104-SEP [Left] and Pinout Diagram [Right]Note: The package was delidded/decapped to reveal the die face for all heavy-ion testing.
Figure 3-2 TPS7H4104-SEP EVM Top View
Figure 3-3 TPS7H4104-SEP EVM Schematics