SBOK095 December 2024 TRF0208-SP
- 1
- TRF0208-SP, Near-DC to 11GHz, Fully Differential RF Amplifier Single-Event Effects (SEE) Radiation Report
- Trademarks
- 1 Overview
- 2 Single-Event Effects
- 3 Test Device and Evaluation Board Information
- 4 Irradiation Facility and Setup
- 5 Depth, Range, and LETEFF Calculation
- 6 Test Set-Up and Procedures
- 7 Single-Event Latch-up (SEL) Results
- 8 Single-Event Transients (SET) Results
- 9 Event Rate Calculations
- 10Summary
- A Total Ionizing Dose from SEE Experiments
- B Confidence Interval Calculations
- C References
3 Test Device and Evaluation Board Information
The TRF0208-SP is packaged in a 12-pin RPV, WQFN - Flip Chip RLF (WQFN-FCRLF, 12) package as shown in Figure 3-1. The TRF0208SP-EVM evaluation board (EVM) was used to evaluate the single-events-effects (SEE) of the TRF0208-SP. Top view of the evaluation board used for the radiation testing are shown in Figure 3-1. Schematic of the evaluation board used for radiation testing is shown in Figure 3-3. For more technical information about the TRF0208-SP, see https://www.ti.com/product/TRF0208-SP/technicaldocuments.
Figure 3-1 Decapped TRF0208-SP (Left) and Device Pin Out (Right)
Figure 3-2 TRF0208SP-EVM Board Top View (Left) and Bottom View (Right)
Figure 3-3 TRF0208-SP Evaluation
Board Schematic for SEE Testing